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Utilizing multispectral data to help explain yield effects in pesticide-free vs conventional and organic wheat and rye

GND
130387539X
Affiliation
Julius Kühn-Institute (JKI), Institute for Strategies and Technology Assessment, Germany
Hachicha, Maya;
GND
1245170163
Affiliation
Julius Kühn-Institute (JKI), Institute for Strategies and Technology Assessment, Germany
Lieb, Robin;
GND
1303875624
Affiliation
Julius Kühn-Institute (JKI), Institute for Strategies and Technology Assessment, Germany
Lorenzen, Marissa;
GND
143656902
Affiliation
Julius Kühn-Institute (JKI), Institute for Strategies and Technology Assessment, Germany
Feike, Til

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Conference:
64. Tagung der Gesellschaft für Pflanzenbauwissenschaften e. V.; Göttingen, Deutschland; 2023.10.04-06
References:
Utilizing multispectral data to help explain yield effects in pesticide-free vs. conventional and organic wheat and rye
(2023)
Date Issued:
2023
Date Issued (print):
04.10.2023
DOI:
10.5073/20230921-132020-0
Language:
English
Type of Resource:
Text
DDC subject of DNB:
630 Agriculture
Institution:
Julius Kühn-Institute, Institute for Strategies and Technology Assessment

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